Combining surface finish measurement and dimensional inspection on the CMM has several advantages over more traditional inspection methods that require a separate process. The SFP2’s automated surface finish inspection, which is powered by 5-axis measurement technology, allows for significant time savings as well as reduced part handling and greater return on CMM investment. The SFP2 system includes a probe and a range of modules, and is automatically interchangeable with all the other probe options that are available for REVO. This means that users have the flexibility to select the tool they need to inspect a wide range of features on the same CMM platform. Data from multiple sensors is automatically referenced to a common datum.
The surface finish system is managed by the same I++ DME compliant interface as the REVO system, and Renishaw’s MODUS metrology software provides full user functionality.
Other benefits include surface finish management that is fully integrated with the standard CMM inspection program, thanks to the automatic changing of the SFP2 probe and stylus holders using the MRS-2 rack and RCP TC-3 ports. The SFP2 probe takes advantage of the infinite positioning and 5-axis movement capability of the REVO head, and an integral probe C-axis along with various tip geometries and a knuckle joint between module and holder provide access to the most difficult to reach features.
With its range of 2D and 3D tactile probes, surface finish measurement and non-contact vision probes, the REVO system makes part inspection on CMMs much faster and more accurate. If you’d like to learn more about the SFP2 system, its features and benefits, and how it can help you make surface finish inspection part of your CMM procedure, you can do so here.
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[Images: Renishaw]